TECHNOLOGY LICENSING OPPORTUNITY: Industrial Lens-Coupled Radiography

This technology, Industrial Lens-Coupled Radiography, enables clearer, faster and more reliable X-ray inspection of large, dense metal parts by redesigning how high-energy X-rays are captured and converted into digital images. Unlike conventional medical-style detectors that struggle with thick or 3D-printed components, this system from Los Alamos National Laboratory uses a more efficient light-collection approach to dramatically improve image quality and inspection speed at megavoltage energies. The result is scalable, high-resolution CT imaging capable of detecting sub-millimeter defects inside complex industrial parts � helping aerospace, defense, energy and advanced manufacturing companies ensure safety, reduce scrap and increase production throughput. How it Works: Industrial Lens-Coupled Radiography operates by first converting incoming high-energy X-rays into visible light within a scintillator designed for megavoltage conditions. That light is then optically relayed to a digital flat-panel imaging sensor, rather than being directly attached in the traditional medical configuration. This optical architecture allows the X-ray conversion stage and the digital detector to be optimized independently for high-energy industrial use. The system captures calibrated reference images alongside inspection images, and software processing corrects for detector and beam variations to produce a uniform, high-fidelity final image suitable for radiography or computed tomography workflows. Technical Overview: Industrial Lens-Coupled Radiography is engineered for megavoltage (?1 MeV) industrial X-ray systems and is optimized specifically for high-energy radiography and computed tomography applications. The architecture separates the X-ray conversion stage from the digital detection stage using optical coupling, allowing each to be independently optimized for efficiency, format size and durability under high-energy conditions. The system supports scalable, large-area detector configurations suitable for high-magnification inspection geometries and integration with commercial flat-panel sensors and industrial microfocus X-ray sources. A structured calibration and correction framework compensates for detector bias and beam non-uniformity, enabling consistent, high-fidelity image reconstruction within standard industrial CT workflows. Key Advantages: Purpose-built for megavoltage imaging � Engineered specifically for high-energy industrial X-ray systems. Higher signal utilization � Captures and converts more usable X-ray energy for clearer imaging of dense materials. Scalable large-format design � Supports inspection of large and complex components. High-resolution defect detection � Compatible with high-magnification inspection geometries for fine feature visibility. Seamless industrial integration � Designed to work with commercial flat panels and existing CT workflows. Market Applications: Aerospace & Defense Additive Manufacturing Energy & Power Generation Automotive & Transportation Nuclear & National Security Development Status: TRL 3 US Patent pending, S-167667.001 LA-UR-26-22770 LANL Tech Partnerships: Unlock the Innovative Potential Los Alamos National Laboratory offers a wide range of cutting-edge technologies and capabilities that may provide your company with a competitive edge in the market and unlock the innovative potential that can enhance, refine, and revolutionize your products. LANL�s licensing program focuses on moving inventions developed by our researchers to commercial innovations. Patented and patent pending inventions and copyrighted software are available to existing and start-up companies through exclusive and non-exclusive licensing agreements. For specific discussions, please contact licensing@lanl.gov. Note: This is not a call for external services for the development of this technology. https://www.lanl.gov/engage/collaboration/feynman-center/partner-with-us/licensing-technology m.lanl.gov/tech-search